Used FOUR DIMENSIONS 280SI #293618563 for sale

FOUR DIMENSIONS 280SI is a wafer testing and metrology equipment developed by Center Seven. This equipment can be used for on-line monitoring, testing, and metrology of wafer surfaces. It offers advanced, fully automated scanning capability for both 2D and 3D metrology. 280SI uses optical 3D technology for measuring wafer shape, size, and thickness, as well as edge profiling. The system provides fast and reliable feedback in the form of a comprehensive report, including dimensions and data analysis. FOUR DIMENSIONS 280SI is designed for automated and reliable wafer surface metrology in a production environment. It has a high accuracy repeatability for all types of wafers, and is capable of 3D scans, edge profilings, and area sampling. 280SI unit also provides a much higher level of digital imaging resolution than many other systems. This increases the accuracy of measurement results, ensuring consistency and repeatability. FOUR DIMENSIONS 280SI includes a range of features and functions, such as data collection software, image inspection, analysis tools, process auditing, and statistical process control (SPC) data analysis. The machine also includes a built-in library of standard wafer types, as well as custom wafer libraries. This ensures accuracy when measuring different wafer sizes, shapes, and thicknesses. The tool boasts a number of other features as well, such as automated detection of wafer surfaces, measurement of defects, determination of individual wafer heights, surface distance measurement, and thickness deviation. Additionally, users can configure 280SI with different measurement tools, including CCD and laser scanning. All of these features provide a comprehensive package of capabilities that allow users to fully automate their wafer testing and metrology processes. Overall, FOUR DIMENSIONS 280SI offers a state-of-the-art wafer testing and metrology asset with unparalleled accuracy, speed, and repeatability. 280SI is an ideal solution for accurately measuring wafer surfaces, great for online monitoring and testing, and for general metrology applications.