Used FOUR DIMENSIONS 280SI #293642472 for sale

FOUR DIMENSIONS 280SI (FD280SI) is a high-performance wafer testing and metrology equipment manufactured by KLA-Tencor. The FD280SI combines a suite of analyzers and metrology tools, including wafer-level metrology, optical inspection, defect review and electrical testing, to provide full wafer-level test coverage. Designed for wafers up to 12 inches in diameter, the FD280SI features an ultra-fast, fully-automated sample transfer system, providing rapid, accurate sorting and efficient sample handling. The FD280SI's advanced image processing and motion control algorithms guarantee the highest level of accuracy, allowing for consistent and repeatable measurements. The unit also includes a full suite of processing tools to compensate for environmental changes and improve the performance of the testers. For optical defect inspection and review, the FD280SI's laser opto-stop motorized wafer inspection machine (LOWIS) allows for high-resolution imaging of wafers with an 80 nanometer minimum spot size. It also provides automated defect classification and defect review databases to ease data analysis. The FD280SI includes multiple analog, mixed-signal and digital die testers (MSPDs) to deliver the highest level of test coverage. These testers are used to judge the electrical behaviour of the die, including evaluating static characteristics, currents, voltages and power levels. The testers also feature density testing, which evaluates the uniformity of a die's features. The MSPD testers also provide automated statistical analysis and defect database review to facilitate diagnosis and resolution of any problems. Lastly, the FD280SI features multiple metrology tools including scatterometry, imaging and FOURIER transform spectroscopy (FTIR). These tools are used to evaluate the physical characteristics of a sample, including surface topography, interface state density, contact resistivity and contour mapping. The FD280SI's metrology tools can also be used to assess the effects of manufacturing and yield changes, enabling efficient product optimization. In summary, 280SI (FD280SI) is an advanced wafer testing and metrology tool designed to deliver full wafer-level test coverage across a variety of tasks. This asset includes multiple testers, image processing and motion control algorithms and a suite of metrology tools that enable users to measure, diagnose and optimize device performance.