Used FOUR DIMENSIONS 280SI #293651601 for sale

ID: 293651601
Probe meter (4) Points.
FOUR DIMENSIONS 280SI is a next-generation wafer testing and metrology equipment designed to help semiconductor manufacturers produce higher-quality products at a lower cost. 280SI features a high-resolution digital imaging system and an advanced optical metrology unit, which allows for precise and accurate measurement of wafers and their structures. FOUR DIMENSIONS 280SI's high-resolution imaging machine provides operators with detailed scans of the surface of each wafer that can be used to identify defects, material homogeneity and uniformity, and other features of the wafer's structure. This information can then be used to adjust processes to optimize product performance and improve yields. 280SI's optical metrology tool is able to measure the curvature, non-planarity, and flatness of the wafers within a few nanometers accuracy. It also includes integrated 3D measurement capabilities, allowing for the detection of extremely fine surface defects. This makes FOUR DIMENSIONS 280SI ideal for applications that require the utmost accuracy or a high degree of repeatability. The asset is operated via a simple user interface and includes a suite of analysis and reporting tools. These tools enable operators to quickly identify defects and other nonconforming features, determine root causes, and adjust processes to improve product yields. 280SI's precision and accuracy make it an excellent choice for semiconductor testing and metrology applications. Its robust design and intuitive user interface make it easy to operate and maintain, while its advanced features and reporting tools enable users to identify and address issues quickly and accurately. By helping manufacturers to produce higher-quality products at a lower cost, FOUR DIMENSIONS 280SI is at the forefront of wafer testing and metrology technology.
There are no reviews yet