Used FOUR DIMENSIONS CV map 02-B #9061502 for sale

FOUR DIMENSIONS CV map 02-B wafer testing and metrology equipment is a fully automated inspection and metrology platform designed to increase wafer yield and ensure optimal product quality. Operating on a magnetic levitated-stage system, the unit offers advanced functionality in a spacious, ergonomic design. The unit can handle wafers up to eight inches in diameter and as thin as 125 μM, requiring minimal sample cutting and exact contact settings. CV map 02-B features a three-dimensional scanning machine with a high-resolution camera that scans across a full 360-degree circle of the wafer, carrying out simultaneous Align-and-Focus (A&F) operations while recording an image for each surface to ensure exact measurements. The scanning tool also includes a high-sensitivity micron lasers and optics that measure wafer thickness while the scan is still in progress. The unit is equipped with a proprietary metrology software suite, which allows for automated hard and soft material measurement and mapping. The software can provide automated methodologies for classifying wafers in order to determine if they meet the necessary industry requirements for production. The asset also boasts a full-featured inspection model that evaluates the texture, shape, and integrity of surfaces of even the smallest dimensions. The inspection equipment includes a high-resolution confocal imaging system that captures images of features not visible to the human eye. It also includes a high-density laser beam generator that targets small areas down to 0.5 μM. The entire unit is controlled by a tool-specific computer interface that includes touch screen navigation, a graphical program editor, and a G-code interpreter. These features make FOUR DIMENSIONS CV map 02-B one of the most user-friendly and reliable wafer testing and metrology systems on the market.