Used FOUR DIMENSIONS CV92-A #9256566 for sale

FOUR DIMENSIONS CV92-A Wafer Testing and Metrology Equipment is an advanced automated solution for the efficient wafer inspection and metrology that combines advanced optical, electronic, and mechanical features. The system consists of a central control unit, a number of test racks and a XYZ automated control-edged platform. The four-dimensional assessment allows for a complete wafer testing and metrology solution by providing an effective measurement from the frontside and/or backside of the wafer. The central control unit of the unit includes a graphical user interface that offers direct control over the machine's settings and features. With it, operators can monitor stationary measurement results as well as set up automated scanning patterns for complete wafer testing and metrology. The automation of the tool further improves the capabilities by providing a fast and accurate measurement of multiple successive wafers. The test racks provide a repeatable platform for accurate and reliable testing of the wafer. The racks have a special design that allows multiple test tools to be loaded and tested at once with fast calibrations. The test tools available for this asset include a laser interferometer, a digital microscope, an atomic force microscopy, an electric potential meter, and a three-dimensional scanner. The XYZ automated control-edged platform provides a repeatable and stable wafer platform, so that the test racks can conduct the testing and metrology tasks on the multiple wafers. It has a high accuracy control resolution that is suitable for both single wafer and large-scale wafer scanning. The platform consists of a movable arm with a vacuum model that provides the necessary stability and motion control for the wafer. The platform is further equipped with a camera to identify and mark the wafer, as well as control and adjust the alignment. FOUR DIMENSIONS CV92A is a complete wafer testing and metrology equipment that includes advanced optical, electronic, and mechanical features. Its unique design allows for the measurement of multiple successive wafers, providing an efficient and reliable solution. The system also includes a graphical user interface with direct control over unit settings, special design test racks, and a XYZ automated control-edged platform that provides the necessary stability for accurate wafer testing and metrology. All these features make CV 92A a state-of-the-art wafer testing and metrology machine.