Used FOUR DIMENSIONS CV92-A #9398905 for sale

FOUR DIMENSIONS CV92-A is a wafer testing and metrology equipment that uses spectroscopic ellipsometry (SE) for advanced 3D metrology of surfaces and materials. The system combines three axes to measure a 4D vector of Euler angles (roll, pitch, and yaw) during the scan. This 4D vector provides highly accurate measurement of surface topography and other materials characteristics. FOUR DIMENSIONS CV92A module allows users to measure wafer dimensions such as thickness, resistivity, surface roughness, and optical dispersion characteristics. It has four optical sensing channels—two for imaging, one for spectroscopy, and one for polarimetry. These are powered by an 8-megapixel CMOS sensor, a high power LED light source, and a broadband UV light source. CV 92A also includes automated focus correction and high precision z-axis control for scanning distances up to 815 mm. Automated sample exchange and sample handling systems are also included for enhanced testing efficiency. CV92-A is designed for use in the semiconductor and FPD (flat panel display) industries, as well as a range of markets including medical device, research, and solar cell fabrication. By using SE technology it is not only capable of accurately measuring local geometries of samples, but also specific 3D information about material properties such as electric permittivity, optical anisotropy, and chemical composition. The unit complies with SEMI-P38 and SEMI-M1 standards and can be used in sophisticated data analysis through a selection of proprietary software packages. These packages enable users to rapidly capture and analyze complex data sets. To ensure reliable precision and repeatability, FOUR DIMENSIONS CV 92A is equipped with automatic stage calibration and alignment functions. It has multiple stages of temperature control, providing thermal stability and accuracy, and is capable of working with a wide range of wafer sizes. The machine also includes intuitive user interfaces and comprehensive reporting capabilities, allowing users to quickly interpret data and view results. CV92A is an advanced wafer testing and metrology tool for industries such as the semiconductor and FPD industries, that combine multiple high specification features for accurate measurements of surface topography, resistivity, surface roughness, and optical dispersion. Additionally, the user-friendly features and custom software packages enable complex data acquisition and analysis.