Used FRT MicroProf CWL300 #9173791 for sale

FRT MicroProf CWL300
ID: 9173791
Profilometer XY-Stage.
FRT MicroProf CWL300 is a high-end equipment or appliance for wafer testing and metrology. It is equipped with powerful imaging and measuring technologies, enabling it to detect even the most subtle changes in wafer thickness, surface flatness and other characteristics. The system incorporates an optical microscope with 5x-50x zoom capabilities to measure flatness and surface characteristics, a structured light surface profiler to measure thickness and curvature, and an image acquisition unit for high resolution inspection. MicroProf CWL300 offers automatic layer thickness metrology, which allows for precise and accurate measurements of wafer layers. It is also equipped with a patented autofocus autograph machine for depth measurement. This technology is designed to reduce the need for manual re-focusing and allows for fast and accurate metrology of wafer layers down to 0.3 microns. The tool also includes a high-resolution image acquisition asset for defect inspection. This allows the user to quickly and easily inspect the wafer for any discrepancies. The model also offers a wide range of features and capabilities. It can work with multiple mediums, including quartz, ceramics, aluminum, stainless steel and other metals. It can measure various wafer characteristics, including surface flatness, thickness, structure, surface roughness, grain size, and carbon nanotube count. It can also measure microwaves with a frequency range of up to 6 GHz. FRT MicroProf CWL300 is designed to be easy to set up and use. Its intuitive user interface and on-board help function make it easy for users to use the equipment. It is designed to be able to perform repeatable measurements and to help eliminate operator error. The equipment also includes an online service for remote access and data transfer. This allows for remote monitoring and support, making it easy for users to monitor performance and make adjustments as needed. In conclusion, MicroProf CWL300 is a powerful and feature-rich system for wafer testing and metrology. It is designed to be easy to set up and use, and to provide accurate, repeatable measurements. With its automated layer thickness metrology, high-resolution imaging, and remote service capabilities, FRT MicroProf CWL300 is an ideal choice for those looking for reliable wafer metrology.
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