Used FRT MicroProf TTV200 #9390955 for sale

FRT MicroProf TTV200 is a non-contact, automated wafer testing and metrology equipment designed to analyze thin films and substrate micro-structures in the semiconductor manufacturing industry. It features dual optical systems, a four-axis motorized stage, and an advanced software platform. At the heart of the system are two optical systems; one for analyzing a sample's film thickness, and a second unit for measuring micro-scale surface features. The film thickness machine utilizes a polarized laser source and a CCD-based detection tool. It provides high-precision measurements of a sample's film thicknesses with accuracy and dynamic range greater than that of conventional optical systems. The surface metrology asset is suitable for measuring the surface topography or texture of micro- or nano-scale features of micro-structures. It uses a high-resolution laser confocal microscope to acquire detailed 3-D profiles of the surface features. It then uses a software-controlled imaging algorithm to distinguish between features and determine shape parameters such as roughness and form. MicroProf TTV200 also features a four-axis motorized stage, allowing measurements to be made across a wide range of wafer diameters. The accuracy of the positioner is very precise, allowing for fast and efficient sample testing. An intuitive software platform makes data acquisition and analysis a breeze. It features comprehensive measurement and data visualization tools, allowing users to obtain accurate and detailed measurements of a sample's structures. In conclusion, FRT MicroProf TTV200 non-contact, automated wafer testing and metrology model provides high-precision, detailed, and reliable measurements of thin films and micro-structures. It features dual optical systems, a high-resolution imaging algorithm, a four-axis motorized stage, and an intuitive software platform.