Used FRT MicroProf #9394687 for sale

FRT MicroProf is a high-precision wafer metrology and test equipment designed to measure and evaluate a broad range of wafer parameters and parameters related to advanced materials. It features a full range of analytical systems offering wafer measurements with sub-micron accuracy to fulfill the needs of complex test and verification operations. MicroProf system is based on FRT advanced imaging technology, enabling submicron accuracy in the measurement of wafer parameters such as thickness, roughness, and existing defects. It is capable of imaging parameters on a range of different substrate materials, including semiconductor wafers, flat panel displays, photomasks, and medical device substrates. It also functions as an advanced platform for test and development of new materials, providing a testing environment to learn about the material's microstructure and physical properties. FRT MicroProf unit can detect, characterize, and measure a variety of metrology and defect parameters including line width, step height, figure of merit, particle size, defect size and density, critical dimension, etch depth and uniformity, and overlay measurement. It is highly integrated with the user's existing semiconductor wafer process machine, providing real-time data transfer and mapping as well as data mining software that simplifies the analysis of data from multiple wafers. MicroProf utilizes a computer-automated optical tool and includes image acquisition, processing, and analysis components. Its fast scanning capabilities and auto-focus and autoshuttle functions deliver precise measurements rapidly. It also features the latest advancements in imaging, illumination, and software technology, enabling the asset to detect small features or analyze complex data from multiple wafers. The advanced software of FRT MicroProf model enables users to perform wafer mapping across the entire wafer surface. Its capability to measure multiple wafers in a synchronized process minimizes reference misalignments between the wafers, making it highly efficient. MicroProf equipment also supports remote handling and provides excellent flexibility for wafer handling and throughput. Finally, the system takes advantage of the unique optical properties of the samples in order to further increase measurement accuracy and reliability. The high-accuracy measurements and optimized imaging allow for accurate interpretation of the parameters measured. Furthermore, the cost-effective design makes FRT MicroProf one of the leading wafer metrology and test solutions on the market.