Used FRT MPR 200 #293607164 for sale

FRT MPR 200 is a highly advanced and efficient wafer testing and metrology system. It can provide complete surface and defect measurements with superior accuracy and reliability. This system is equipped with a unique dual-emission detector that increases sensitivity and maximizes the speed of test and measurement performance. MPR 200 is equipped with a suite of powerful software processes that are used to analyze, inspect and test thin-film structures and features on semiconductor wafers. Its automated inspection algorithms can identify yield-limiting defects and provide maximum sensitivity for measuring dopant profile data and thick films. Its self-calibration and auto-correction processes further reduce data processing time. FRT MPR 200 uses a non-contact detection method utilizing an automated probe carriage and a sample motion stage that positions and scans the sample as required. MPR 200 can find random, recurring, and line-to-line defects. It has low noise and high accuracy in detecting sub-micron defects and even the smallest line-width deviations. FRT MPR 200 also offers precise and repeatable accuracy in the measurement of metal, poly-silicon and oxide film thicknesses, dopant concentrations and critical dimensions. Through its precise measurements and multiple-defect inspection capabilities, MPR 200 facilitates improved process control and product quality. It also provides exceptional corollary data to aid in the analysis, troubleshooting and debug processes. Overall, FRT MPR 200 is a reliable and powerful wafer testing and metrology system that offers unparalleled accuracy and speed. Its advanced features and powerful detection capabilities allow for the detection and characterization of multiple defects and materials, as well as precise measurements of film thickness, dopant concentrations, critical dimensions and other characteristics. Its integration of self-calibration and auto-correction processes ensures that data processing times are kept to a minimum and its non-contact detection method provides superior accuracy and reliability.