Used FSM / FRONTIER SEMICONDUCTOR 128 #293595237 for sale

FSM / FRONTIER SEMICONDUCTOR 128 is a wafer testing and metrology equipment that is used to evaluate and characterize die on small-scale semiconductor wafers. It was developed by FSM Inc. as a tool to test and measure the electrical, optical and physical features of dies mounted on semiconductor wafers. FSM 128 system uses a cantilever-style pick-up to accurately place dies onto the substrate of a wafer. It can detect, identify and measure individual dies from a variety of substrate materials and sizes. It also reads die barcodes and provides detailed die characterisation information. The unit is able to perform a range of wafer-level tests, such as carrier mobility, contact resistance and DC leakage measurements. It also contains a scanning electron microscope that provides an atomic-scale view of the surface of the wafer, enabling in-depth measurement of the wafer surface feature size and distance. FRONTIER SEMICONDUCTOR 128 machine has high-precision optical imaging, which allows it to accurately locate, inspect, measure and identify defects in individual dies. It provides comprehensive analyses of the wafer's electrical, mechanical and optical characteristics, offering a comprehensive wafer testing and metrology solution. In addition to its testing capabilities, the tool also allows for data storage and analysis of the results. It provides a simple user interface, allowing for easily accessible and intuitive operation. 128 is a highly advanced wafer testing and metrology asset available for use in a variety of applications. It is a valuable tool for the evaluation and characterisation of die on small-scale semiconductor wafers, allowing for full control and characterisation of wafers.