Used FSM / FRONTIER SEMICONDUCTOR 128 #9293060 for sale

FSM / FRONTIER SEMICONDUCTOR 128 is a wafer testing and metrology equipment designed to accurately and quickly evaluate the properties of semiconductor wafers. It is equipped with a high accuracy, high resolution inspection system and a sophisticated metrology program. The unit is capable of handling both conventional and nanometer sized wafers and provides fast wafer characterisation and mapping, offering excellent repeatability and reliable performance. FSM 128 enables fast and accurate wafer testing and analysis with its high precision digital image processing machine. The tool is capable of detecting microscopic and sub-micron structural defects such as cutting edges, contamination, holes, etc. on the wafer surface. The metrology software, which offers a range of parameters such as width, depth, linearity, etc., helps identify process drift and yield issues caused due to etching and lithography processes. The asset also enables calibration to measure and compare in-plane dimensions of various parts of the mask and wafer, as well as out-of-plane deviations from flatness. FRONTIER SEMICONDUCTOR 128 offers high speed wafer testing, enabling a throughput of up to four boards at a time, and allows for non-contact inspection from up to one million microns per second. Other features of the model include automated wafer loading, automatic defect recognition, and intuitive user-friendly software for quick setup and operation. Additionally, the equipment is equipped with an integrated database that enables tracking of wafers and defects for further analysis. 128 is built for ease of use and reliability, with a robust hardware design and special components to ensure maximum performance and accuracy. It has also passed a thorough quality assurance program and extensive validation tests to ensure precise metrology performance. The system is compatible with almost all available test systems, making it a great choice for wafer testing and metrology applications.