Used FSM / FRONTIER SEMICONDUCTOR 128 #9396059 for sale

FSM / FRONTIER SEMICONDUCTOR 128 is a leading automated test and metrology equipment for wafer-level testing of optoelectronic and semiconductor devices. The system is designed to provide a comprehensive suite of measurement solutions that are tailored to the specific requirements of the device's application. The unit components include both an integrated and stand-alone test and metrology modules which can be configured to support a variety of requirements. The most basic suite of modules includes a multi-channel testing and measurement station, a micro-lithography module, a sputter deposition platform, a diffraction module, an imaging apparatus, and a data acquisition station. In addition, the machine also includes a multidimensional automated test and metrology tool designed specifically for testing and characterizing optoelectronic and semiconductor devices. FSM 128 asset also provides a high level of flexibility in the testing of devices. The model supports a broad range of test conditions, including array measurements, high-speed high-precision tests, high-frequency tests, and high-power tests. The equipment also supports comprehensive fault and performance characterization capabilities, as well as automated analysis functions. The system uses an innovative camera-based optical wafer inspection unit to allow for the most precise measurement of devices at the wafer level, providing higher accuracy and faster results. The machine also supports ultra- sensitive measurements, such as those necessary to characterize low-power devices. Furthermore, the tool is capable of measuring DC and AC signals with extremely accurate current and voltage lines. In addition, FRONTIER SEMICONDUCTOR 128 features a high-throughput productivity asset that not only optimizes the measurement of devices but also allows for the reuse of device test data. The model also supports a wide range of data capture and analysis options, including data merging, time-domain spectral analysis, parametric measurement methods, and device characterization. Overall, 128 wafer testing and metrology equipment is a highly sophisticated, advanced, and comprehensive system that is capable of handling a variety of test and metrology requirements. With its comprehensive suite of measurement capabilities, the unit offers a flexible and powerful solution for characterizing and optimizing optoelectronic and semiconductor devices.