Used FSM / FRONTIER SEMICONDUCTOR 128L C2C #293624609 for sale
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ID: 293624609
Wafer Size: 12"
Vintage: 2002
Film stress measurement system, 12"
SECS / GEM
Integrated wafer substrate
2D and 3D wafer mapping
Brooks robot
(2) FOUP front load
Power supply: 120VAC, 20AMP, Single phase
2002 vintage.
FSM / FRONTIER SEMICONDUCTOR 128L C2C is a equipment for wafer testing and metrology. It is used to measure and analyze electrical properties of semiconductors. The system consists of a wafer handling stage, a C2C imaging and electrical test module, and a metrology module. The wafer handling stage allows for easy loading and unloading of wafers. It is capable of transferring the wafers up to a range of 1.2 meters and can accommodate up to 200mm and 300mm wafers. This stage also helps regulate temperature and humidity during the test process. The C2C imaging and electrical test module contains a contactless current sensor (CCS) which captures C2C images of the wafer. The CCS also produces transient current signals that are used to measure the semiconductor device characteristics such as leakages, breakdowns, and other anomalies that may be present. The metrology module uses SEM imaging and automated scanning of the wafer to measure and analyze the size, location, and shape of individual semiconductor elements. This module is also capable of performing automated data integrity checks, ensuring that the measurements and data collected are accurate and reliable. FSM 128L C2C unit is an excellent tool for testing semiconductor components, as it provides quality data and thorough analysis of wafer conditions. The machine also offers quick and easy wafer loading, excellent imaging capabilities, and automated metrology measurements. All of these features combine to deliver highly accurate and reliable results, making it the ideal solution for wafer testing and metrology.
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