Used FSM / FRONTIER SEMICONDUCTOR 128L C2C #293760135 for sale

FSM / FRONTIER SEMICONDUCTOR 128L C2C is a wafer testing and metrology equipment designed for use in the semiconductor industry. It is capable of optically characterizing devices on a wafer in both the short-wavelength (visible) and long-wavelength (infrared) ranges. The system includes a high-resolution optical microscope, scanning electronics, data processing and storage and high-precision angular alignment and displacement (leveling) stages. The optical microscope is equipped with two distinct optical paths, one for the visible range and the other for the infrared. Each optical path has multiple lens elements with a combined magnification of up to 1000x. The microscope can measure device characteristics such as geometric dimensions, physical properties, electrical performance, surface texture, film thickness and more. The visible path is also equipped with an integrated autolens focusing unit to ensure an optimal image resolution. The scanning electronics are capable of detecting and digitizing signals from photodiodes. The signals are then processed to produce high-precision maps of the device characteristics of the wafer. The scanning capabilities include block, distribution, area and global scans. The data can be exported to PC for further analysis or be used in the integrated device profiling software. FSM is equipped with high-precision angular and displacement stages to position the lens and moving parts. These stages use a XYZ drive machine to precisely adjust the distance and angle between the lens and the device being tested. The tool also incorporates a leveling wedge for automated alignment of the wafer for uniform testing. FRONTIER SEMICONDUCTOR is designed with convenience and safety in mind. It features an integrated control and analysis software with user-friendly controls, an autofocus feature for direct image acquisition, an accident prevention mechanism, and a 500W halogen lamp that can provide up to 30min of uninterrupted illumination at reduced power consumption. Overall, FSM 128L C2C is a comprehensive wafer testing and metrology asset designed to provide fast, precise and reliable results necessary for the semiconductor industry. It features optical diagnostics, scanning electronics, data processing and storage, high-precision stages and auto-focus capabilities as well as user-friendly controls and safety mechanisms. FSM / FRONTIER SEMICONDUCTOR can be used to measure device characteristics such as geometric dimensions, physical properties, electrical performance, surface texture, film thickness and more with high accuracy and repeatability.