Used FSM / FRONTIER SEMICONDUCTOR 128L C2C #9354274 for sale

The FSMLFSM / FRONTIER SEMICONDUCTOR 128L C2C is a versatile and advanced wafer testing and metrology equipment. It has been designed to provide fast, non-destructive, and automated metrology and wafer testing services in a high throughput environment. The system features FSM 128L C2C imaging technology, which utilizes high-resolution imaging and advanced optics to provide accurate results for advanced metrology capabilities over a wide range of applications. The unit is able to detect feature sizes as small as 3µm and accurately detect defects on any type of semiconductor material. The FSMLFRONTIER SEMICONDUCTOR 128LC2C is also equipped with a number of advanced features including: High-speed pattern recognition: The machine is able to quickly and accurately detect defects on both wafers and masks, including single and multi-pitch, multi-layer wafer test patterns. Automated metrology measurements: Automated systems can help ensure that accurate measurements are taken consistently. The tool is equipped with an advanced metrology asset which allows for automated defect detection and characterization of multiple metrology characteristics. Advanced software: The model includes a state-of-the-art software package that is designed to enable rapid and reliable data extraction. The software is also equipped with user-friendly features to enable quick and easy operation. High-resolution imaging: The equipment features advanced optics and high-resolution imaging technology for precise metrology. This assures accurate results. Multi-measurement capabilities: The system can measure a wide variety of parameters including CD, critical dimension, overlay, roughness, film thickness, and more. This enables the unit to have a wide range of applications. Automation and integration: The machine can be fully automated, allowing for increased throughput and reduced cycle time. It can also be integrated into a wide range of production environments. The FSML128LC2C tool is an efficient and highly reliable wafer testing and metrology asset. With the combination of advanced imaging, automation, and multi-measurement capabilities, the model is capable of providing accurate results quickly and reliably. Thus, it is an ideal equipment for a variety of wafer testing and metrology applications.