Used FSM / FRONTIER SEMICONDUCTOR 128NT #293768602 for sale
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ID: 293768602
Wafer Size: 12"
Vintage: 2013
Film stress measurement system, 12"
Film stress range: 1 MPa to 1.4 GPa
Scan range: 3 mm
Mapping: 32 Scan lines with 40 Data points/mm
Bow measurement: up to 2000 μm
Wafer compatibility: 50 mm to 200 mm
High-precision single scan
Programmable multiple diametric scans for 2D/3D
Repeatability: 1% (1 Sigma) on a 20 m
Accuracy: <2.5% Based on a 20m
PC
Processor: Intel Core i5
Memory: 2 GB RAM
Hard Disk Drive (HDD): 1 TB
(4) USB Ports
(2) Ethernet ports
Operating system: Windows 7
Power supply: 110-220 V, 20 A
2013 vintage.
FSM / FRONTIER SEMICONDUCTOR 128NT is a wafer testing and metrology equipment that helps to enhance overall product quality. This system uses non-contact optical sensors that facilitate accurate and reliable measuring, metrology, and dimensioning tasks in a fast and efficient manner. It can be used for multiple applications such as; thin-film evaluation, scribe line thickness measurement, overlay accuracy, and profile measurement. FSM 128NT features a precise and automated measurement process in order to ensure high quality and increased accuracy of results. This unit is designed with an optical microscope machine and optical sensor measuring module that enable the user to accurately and quickly measure any wafer dimensions. In addition, the tool includes software packages that enable users to visualize the measurement data in a variety of different formats. FRONTIER SEMICONDUCTOR 128-NT also includes a 16-bit image capture asset that allows users to save images for further data analysis. This model utilizes a field of view ranging from 0.1mm x 0.1mm to 0.7mm x 0.7mm. The integrated software packages allow users to create custom measurement templates and also to set up levels or offset points. To improve efficiency and accuracy, the equipment allows users to import material library parameters, as well as to integrate the collected material data with Geometric Dimensioning and Tolerancing (GD&T). Furthermore, the user can set parameter limits for various applications, including maximum and minimum values and margins. FSM 128-NT is equipped with an Anti-reflection (AR) film detection system that is designed to reduce the equipment's false alarm rate. This unit also provides one-click auto-calibration which facilitates faster and simpler operation. Overall, FRONTIER SEMICONDUCTOR 128NT is a highly reliable and accurate wafer testing and metrology machine that can help to improve the overall product quality in different types of industries. The tool is designed with a wide range of features that make it perfect for a variety of applications.
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