Used FSM / FRONTIER SEMICONDUCTOR 128NT #9311397 for sale

FSM / FRONTIER SEMICONDUCTOR 128NT is a wafer testing and metrology equipment designed to provide end-to-end process capabilities. This system enables chip makers to identify potential root causes of yield loss and improve process conditions. FSM 128NT includes a variety of hardware, software, and metrology tools. The unit utilizes pneumatically controlled mechanical stages to handle wafers up to 8 inches in diameter, while also allowing for fine adjustments for flatness and tilt. The stages are designed to be compatible with various types of test and metrology systems, including focused ion beam, failure analysis, optical inspection, conductive atomic force microscopy and other probing techniques. The machine also features a multi-channel floating chuck with an adjustable chuck temperature range that can be controlled from 1°C to 300°C, allowing for flexibility when testing various types of materials and processes. In addition, its die-map generator enables the user to easily select, edit, and save wafer maps, and a sample location recognition tool is also included, allowing rapid sample handling with higher accuracy. The included metrology asset features an integrated optical metrology model that can measure the patterned features using various laser interferometric techniques to determine the etch depth, CD uniformity, and other parameters. FRONTIER SEMICONDUCTOR 128-NT also offers data correlation in order to detect and track across multiple test and metrology channels. This ensures that data captured at each stage is properly correlated and can be tracked over time. The equipment also features a scalable platform that can be designed to meet specific production line requirements. This reduces the need for separate wafer testing and metrology systems, and allows the user to customize and reconfigure the system as needed. 128NT is a comprehensive wafer testing and metrology unit, providing the tools and features necessary to achieve the highest levels of yield and performance. Its combination of hardware, software, and metrology tools make it an ideal fit for research and development, as well as production level applications.