Used FSM / FRONTIER SEMICONDUCTOR FSM 128 C2C #9248258 for sale

ID: 9248258
Vintage: 2002
Film stress measurement system 2002 vintage.
FSM / FRONTIER SEMICONDUCTOR FSM 128 C2C Wafer Testing and Metrology Equipment from FSM (FRONTIER SEMICONDUCTOR) is a high-speed automatic wafer metrology and testing controller designed to provide precise, fast and reliable measurements for up to 128 wafers at a time. The system incorporates the use of a motorized 6-axis stage which drives the wafers in a circular pattern that allows for precise positioning of the wafers within the unit. This ensures accurate measurement of features on the wafer, which, in turn, allows the machine to perform efficiently and with the expected accuracy. The tool is equipped with a proprietary die attach technology that allows for the automatic loading and unloading of wafers and die. This ensures a smooth process for testing each wafer and allows for less wastage of wafer space. The asset uses advanced vision recognition and analysis of the wafers to provide an accurate read out of the die while minimizing the potential for errors. This ensures that the tests performed on the wafers are accurate and consistent, saving both time and costs. The model also takes advantage of laser-based metrology techniques for measuring the shapes, sizes and patterns on the wafer surface. This allows for more precise and accurate measurements compared to traditional methods. The laser-based metrology techniques are also capable of measuring features on the wafers much faster than manual methods, ensuring that the throughput is not compromised. Finally, the equipment is compatible with a wide variety of products and parts, making it a very versatile tool. It can be used for various types of wafers and parts such as memory, CPU, printed circuits and microchips. This high degree of compatibility ensures that the system can be utilized for a wide range of tests and is a great asset for any organization. In conclusion, FSM FSM 128 C2C Wafer Testing and Metrology Unit is a high-speed, efficient and cost effective wafer testing and metrology machine designed to provide precise and accurate results on a wide range of products and parts. The tool utilizes advanced technologies such as die attach, vision recognition and laser-based metrology as well as a motorized 6-axis stage to achieve its high levels of performance. With its versatile uses and affordable cost, FRONTIER SEMICONDUCTOR FSM 128 C2C asset is an excellent choice for any organization looking to test and measure components quickly and accurately.
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