Used FSM / FRONTIER SEMICONDUCTOR FSM 128 #293637732 for sale

ID: 293637732
Wafer Size: 4"-8"
Vintage: 2001
Film stress measurement system, 4"-8" Operating system: Windows XP Does not include: Monitor Mouse Keyboard 2001 vintage.
FSM / FRONTIER SEMICONDUCTOR FSM 128 is a comprehensive wafer testing and metrology equipment from FRONTIER SEMICONDUCTOR. It is a scalable tool, with the ability to adapt to various fabrication processes and requirements, making it a favored solution for discrete device, power device and MEMS manufacturers. FSM 128 offers a wide range of measurement modes for dielectric, RF and electron devices. This includes Measurement of Device Parameters (MDP), Device Parameter CornerTec (DPT), and Total Energy (TE). It is able to measure capacitor and resistor values, leakage and ESD measurements, FET drain current and gate voltage, as well as a variety of MEMS parameters. The system is capable of acquiring and collecting multiple levels of data, including at the wafer and device level. The unit has integrated automated calibration and calibration control, making it easy to adapt to any environment. This provides the flexibility to adjust measurement parameters as conditions change, while maintaining a consistent level of accuracy and speed. In addition, the wafer chuck is equipped with image recognition and registration, allowing the tool to detect wafer locations in real time. FRONTIER SEMICONDUCTOR FSM-128 includes a suite of software tools to provide complete measurement and metrology capabilities. This includes built-in temperature control, data analysis, data collection, and reporting tools. The machine is also equipped with integrated control and fault isolation to aid in troubleshooting and process improvements. Finally, 128 also features a wide range of hardware for sample handling, including a die sort tool, a wafer loader, support wafer handling equipment, and an additional cassette tray. The tool includes a number of highly accurate probes and alignment mechanisms to ensure accuracy and repeatability. In sum, FRONTIER SEMICONDUCTOR 128 provides a comprehensive set of wafer testing and metrology capabilities. It is designed for flexibility and scalability, making it a great solution for a wide range of fabs and processes. The integrated temperature control, data analysis, data collection, and reporting tools, as well as the suite of hardware-based sample handling, provide an accurate and reliable means of manufacturing high-quality and high-performance devices.
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