Used FSM / FRONTIER SEMICONDUCTOR FSM 128NT #201040 for sale

FSM / FRONTIER SEMICONDUCTOR FSM 128NT Wafer Testing and Metrology Equipment is an automated testing and measurement solution designed to help semiconductor fabs meet the high-reliability goals of today's manufacturing process. FSM 128NT is optimized for a broad range of technologies from deep sub-micron to MEMS and optoelectronics, and uses the latest non-destructive test technologies to validate yields and ensure consistent quality. The system offers advanced automated wafer test and analysis capabilities, enabling semiconductor companies to achieve greater levels of process control and process reliability. It uses a combination of motion control and optics technologies, including a high-resolution, capabilities-based optical metrology unit and multi-zone, multi-function motion control technologies. Automated defect detection and review enable fast, highly accurate test results. FRONTIER SEMICONDUCTOR 128-NT is equipped with a powerful graphical user interface that provides an easy-to-use and intuitive experience. Its off-the-shelf software makes it easy to customize and maintain; additional features enable users to access and review test results over a network, in real time. Additionally, the machine delivers state-of-the-art process control capabilities including defect classification and review to decrease time-to-market and improve wafer test results. The tool's hardware is designed to support a variety of wafer sizes, from 3.2-inch up to 200 mm, as well as a range of test technologies including parametric and transient analysis, and package-level testing. The asset includes pre-production test solutions, which enable designers to perform automated testing on processes with different test plans and tolerances. With 128NT, test times are dramatically reduced, and production processes are increased in efficiency. The automated test and analysis process can reduce processing time, typically on the order of 10 to 20 percent, freeing up valuable production time. Moreover, data analysis capabilities, such as statistical process control, provide for accurate and repeatable results. In addition, FSM 128-NT is highly configurable and offers a number of features that enable its users to customize their test and analysis process for optimal results. Advanced features, such as multiple pattern recognition, allow the model to identify and classify subtle and difficult-to-detect defects, which are often difficult to identify with manual testing. Furthermore, the equipment offers modular inspection and sign-off in areas where manual inspection is difficult or time-consuming. FSM / FRONTIER SEMICONDUCTOR 128-NT is an advanced wafer testing and metrology system, ideal for ensuring the high reliability of semiconductor fabrication processes. Its automated test and analysis capabilities are designed to be highly accurate, repeatable, and efficient, reducing time-to-market while improving yields. The unit is compatible with a wide range of technologies and offers comprehensive data analysis capabilities for accurate, repeatable results.