Used GCA / TROPEL II-150 #9285600 for sale

GCA / TROPEL II-150 wafer testing and metrology equipment is an advanced and highly automated solution for metrology of flat, planar surfaces of semiconductor devices, such as silicon wafers. It performs a variety of critical surface measurements with high accuracy, utilizing a low-magnification optical microscope integrated with stage, alignment, and imaging components. GCA II-150 has a maximum dynamic range of up to 300 microns and can measure from very small to very large patterns. It can measure up to 8 × 10 device and it is designed to minimize operator influence on the accuracy of the results. The system includes an advanced frame-grabbing imaging unit that allows simultaneous acquisition of multiple images of the same surface, allowing for improved image quality and automatic optimization of imaging conditions. TROPEL II-150 utilizes a 4-point alignment scanning tech-nique for the automatic registration of multiple images. This allows the machine to map the entire area with micron level accuracy. The tool also includes a range of analytical tools for 3D imaging, allowing for detection of surface defects, from extraneous material or irregularities, as small as 10 nm. The asset includes a powerful automated planar surface emitter, providing a critical capability for measuring patterned surfaces. This feature ensures consistent, repeatable results for flatness measurements and it allows for more accurate replication of complex shapes. The model's Total Focus technology acquires all of the data from multiple depths within the device simultaneously, allowing for improved surface characterization. II-150 is an easy-to-use and highly reliable equipment, that ensures accurate, repeatable results for the measurement of any planar surface. It is well suited for use in any semiconductor manufacturing environment and is a cost-effective solution for metrology and wafer testing.