Used GERMANY DEKTAK 150 #9315626 for sale

GERMANY DEKTAK 150 is a wafer testing and metrology equipment designed to provide accurate measurements of critical component features on semiconductor substrates. DEKTAK 150 utilizes a continuous scanning laser beam mounted on a vertical scanning head unit. This sophisticated system is designed to accurately measure the surface of wafers up to 6 inches in diameter with precision up to 0.5 nanometers. As such, GERMANY DEKTAK 150 is ideal for measuring critical features such as step heights, surface profiles, and surface flatness on silicon wafers in a wide range of industries including semiconductor, medical device, and automotive. DEKTAK 150 has the capability to measure a wide variety of features, from single steps to complex patterns, and can analyze surfaces with very fine line widths or minute surface defects. The unit also uses a variety of sophisticated image analysis algorithms that can detect and analyze surface features and irregularities. GERMANY DEKTAK 150 is equipped with a variety of imaging technologies such as video microscopy, laser microscopy, fiber optic interferometry, and near-field imaging, all of which can be used to capture images of the components in 3 dimensions. In addition to advanced imaging capabilities, DEKTAK 150 has an adaptive laser power machine that ensures consistent scan quality and the most accurate measurements. The tool also offers dynamic focusing, which allows for optimized focus regardless of the angle of the surface being measured. GERMANY DEKTAK 150 is also equipped with highly accurate linear feedback motors that ensure precise x, y, and z scanning movements without vibration. Finally, the asset contains cutting-edge software that provides a host of helpful features such as a library of standard measurement functions, real-time process monitoring, live image analysis, event logging, intuitive graphical user interface, quick analysis setup, and data transfer capabilities. The user-friendly software makes it easy to select measurement parameters, interpret results, and output data in various file formats as well. Overall, DEKTAK 150 is an ideal wafer testing and metrology model for a wide range of industries. Its advanced imaging capabilities and sophisticated software features coupled with its reliable scan quality and accuracy make it an invaluable tool for accurately measuring critical components on semiconductor substrates.