Used GIGATECH TSA 2000 #9251588 for sale

GIGATECH TSA 2000 is a robust and reliable wafer testing and metrology equipment from GIGATECH, Inc. that is designed to provide accurate and comprehensive test and metrology results for silicon wafers and other advanced semiconductor materials. The system is designed to measure the thickness, resistivity, prime surface details, and other physical properties of the wafer. It is also capable of measuring and measuring deviation from a calculated target profile, as well as detecting step height, step tracking, and step discontinuity. The unit can also be used to measure the die attributes. It is equipped with a HID-enabled hard disk drive for robust data profiling abilities. The machine includes an open platform controller, which is used for control and data acquisition purposes. It is also equipped with an integrated HMI (Human Machine Interface) which provides easy access to the tool's functions and features. TSA 2000 also comes with a range of software packages that are designed to provide comprehensive analysis of wafer test data. The test and metrology measurements are extremely rapid, and the asset has an advanced feature set that allows it to test various types of wafers quickly and accurately. The model uses advanced algorithms to provide fast, accurate results while minimizing the amount of time spent on measurements. The equipment also offers high sampling rates with low latency, as well as an intuitive user interface which makes it easy to use. In addition to GIGATECH TSA 2000 system, GIGATECH, Inc. also offers a comprehensive suite of calibration kits and accessories, which are designed to help users minimize the amount of time and resources used when calibrating and verifying the unit's accuracy. The calibration kits also come with several different types of wafer analysis tools which can be used to analyze the various test results and analyze them in a comprehensive manner. Overall, TSA 2000 is a reliable and robust wafer testing and metrology machine, equipped with a range of features and techniques that makes it suitable for a variety of advanced semiconductor applications. With its fast, accurate results and comprehensive analysis capabilities, the tool is an ideal choice for all types of semiconductor applications.