Used GMTECH Semichem #9395375 for sale
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ID: 9395375
Measurement system
IonChem
AnaChem
APM 200
Floormount assembly dimension (W x D x H): 29" x 24" x 75.7"
90mL Measuring cell with mixer motor
RS232
Ethernet
USB
(4) Analog outputs: 20mA
(8) Displayed outputs
(8) Relay contacts for alarms
PLC Handshaking
(3) Digital burettes: 5mL
Start up kit
Manual.
GMTECH Semichem is a wafer testing and metrology equipment designed to perform accurate measurements of wafer surface characteristics. It can measure a wide range of nanometer-scale features, such as line widths and overlay accuracy, using X-ray spectroscopy and electron spectroscopy techniques. The system has the advantage of being both accurate and fast, allowing engineers to quickly obtain the data they need to analyze the effectiveness of their design processes. Semichem can measure surface features over an area of the wafer up to 5 millimeters in diameter with high accuracy. It uses multiple X-ray optics systems which include X-ray sources, X-ray diffractometers and X-ray detectors. The X-ray sources generate X-ray pulses which interact with the wafer surface features, creating diffraction patterns that can be analyzed to calculate line widths and overlay accuracy. The X-ray detector then captures the diffraction and sends the data back to the analysis unit, where engineers can interpret the data and make any necessary adjustments to their design process. The machine is also capable of performing light microscope wafer analysis. This includes uses such as inspecting defects, examining surface topography, and determining the thickness of thin films. This type of analysis can be performed over a wide range of magnifications, allowing for a comprehensive look at the wafer surface. The microscope images can be used to guide metrology data analysis in order to ensure that it is correct and meaningful. GMTECH Semichem tool is designed to be user-friendly and efficient. It features a built-in physics library containing basic spectroscopic parameters, ensuring that engineers get an accurate result with minimal effort and time. It also features an intuitive graphical user interface, allowing users to configure the asset to meet their exacting requirements. The model is also available with integrated metrology subsystems, such as X-ray source and optical microscope, allowing for improved results without requiring extra hardware. Semichem equipment is ideal for use in semiconductor design and production environments, where it can provide essential data to guide and improve processes. Its high accuracy and speed allows engineers to quickly adjust and adapt their designs to ensure maximum efficiency, yield, and profitability. Additionally, its intuitive and user-friendly features make it suitable for use by engineers of all skill levels.
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