Used GO TECH Taber #9075595 for sale
GO TECH Taber is a comprehensive wafer testing and metrology equipment. This state-of-the-art system combines a range of capabilities, including wafer-level defect detection, electrical and optical measurements, defect inspection, 3D measurements, wafer motion control, and data analysis. The unit can be used to acquire high- resolution images of both planar and three-dimensional features in a wafer as well as common electrical characteristics of a device under test. By providing a variety of software packages, Taber allows customers to select the most suitable package for their application. The machine is equipped with a dedicated software, called GTM (GO TECH Measurement). This software offers advanced features such as automatic edge detection, non-contact 3D topography mapping, shape-based image processing, optical microstructure inspection, alignment scans, spectroscopic measurements, verticality measurements, and photolist inspection. The GTM software collects and manages all the data generated, making it possible to use the data for process and yield analysis, proof of compliance, and a variety of other applications. This software can be configured to meet the specific needs of the customer and is able to interact with other international software packages. GO TECH Taber also offers specialized wafer handling capabilities. It provides wafer positioning for any device with the help of an X-Y stage, allowing wafer loading and unloading with minimal movement and maximum precision. This is especially useful for measurements on specific locations on the wafer or for inspection of wafers with different characteristics. Taber is a user-friendly and efficient tool, allowing for rapid collection of a range of high-quality data. With its versatile range of capabilities, the asset helps improve wafer testing and metrology, enabling customers to realize a faster time-to-market and higher quality products.
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