Used HANDTMANN PBZ DL 5 #9043099 for sale

HANDTMANN PBZ DL 5 is a high precision wafer testing and metrology equipment providing excellent analysis and inspection of ICs and wafers. It is designed for testing and characterization of wafer level defects, particle contamination, etc. that causes yield loss. PBZ DL 5 integrates a number of important features to improve accuracy and speed of analysis and inspection. It includes a precision scale set up to measure wafer thickness with a resilience of 1 μm. The system is equipped with a precision optics module and an ergonomic design, which allows for precise and fast alignment of wafers and ICs. Sub-micron lateral resolution is achieved through a mix of optical improvement and a high speed scanning unit. Additionally, HANDTMANN PBZ DL 5 has a wide range of analysis and defect characterization tools to provide comprehensive defect analysis. It is also equipped with breakthrough fault diagnosis technology for particle contamination and wafer level defects. This technology is used to detect electrical failure due to microscopic particles and scan image patterns for analysis of through-hole defects. Furthermore, its particle detection capability is able to accurately measure the size, location and number of particles which helps to identify the source of particle contamination. PBZ DL 5 has an AccuPatch option, which is a powerful data acquisition machine that provides data analysis capability and support for the fault diagnosis process. This helps speed up the fault diagnosis process and prevent yield loss problems. Besides that, HANDTMANN PBZ DL 5 has a range of metrology tool such as parametric testing, on-chip testing, and scanning electron microscope imaging (SEMI). This helps to provide a thorough metrology of wafers and ICs with efficient and reliable assessment, allowing for complete analysis of ICs and wafers. Finally, its advanced software package is compatible with CAD/CAE/FEA/ analog/RF tools which help to facilitate the development process. The integration of 3rd party software allows for more comprehensive data analysis. With the combination of various features, PBZ DL 5 offers a unique combination of features for wafer testing and metrology.