Used HANRA HRI 580L #293635049 for sale

HANRA HRI 580L is a specialized wafer testing and metrology equipment designed for characterizing semiconductor materials. The system features a uniquely designed optical microscope, laser scanning microscope, and a writing station that allows for automated testing of wafers. This unit is suitable for nanometer level observations of nanoelectronic devices, measuring topography, electrical properties, and more. The Laser Scanning Microscope (LSM) module utilizes an optical microscope combined with laser optics to measure topography, allowing for a resolution as low as 1nm over a large area image. This machine can identify wafer defects and monitor surface morphology. The LSM also ensures that the scanned images contain accurate coordinates through the use of laser positioning technology. The automated writing station of HRI 580L enables highly precise writing tasks without manual operation. It uses correctable jets aligned to the desired writing trajectory and can reach a minimum of micron-accurate writing resolutions. This writing station enables wafer-level automated tasks such as topographical analysis, overlay calibration, and electrical property analysis. HANRA HRI 580L is designed for high-end testing and metrology applications, and provides all the features necessary for such purposes. It does this with an integrated touch panel interface, and high-specification components that ensure accuracy and reliability. The tool has a working area of up to 10 inches in diameter, allowing for the scalability of larger tasks. In addition, the asset has a large dynamic range, allowing for greater flexibility and range of applications. Overall, HRI 580L is a specialized wafer testing and metrology model designed for characterizing semiconductor materials. The equipment is composed of uniquely designed optical microscope, laser scanning microscope, and automated writing station. This combination of features enables accurate, reliable testing of nanometer level observations of nanoelectric devices, topography, electrical properties, and more. As such, this system stands as a high-end solution for a wide range of wafer testing and metrology applications.