Used HANRA HRI 580L #9268343 for sale

HANRA HRI 580L is a comprehensive wafer testing and metrology equipment designed to provide advanced nanoelectronic and photomask metrology capabilities. With a modular design, this system can be customized for a range of specific metrology applications and can generate a broad range of results with superior metrology accuracy. The unit is designed to characterize the wafer's topography, the surface of the wafer, its electrical, optical, and dielectric properties, and the patterns created on the wafer for micro-structure. The patented nanotester feature of HRI 580L allows for the performing of high-speed electrical testing and characterization of nanostructures with nanowire fabrication. High-resolution imaging capability up to 11.2ums (µm) resolution is available, along with a suite of world-class optical metrology systems including UV-VIS-NIR spectrophotometry, ellipsometry, AFM, FTIR, and spectroscopic ellipsometry. HANRA HRI 580L also has superior chip-level test and measurement capabilities, including a suite of high-accuracy meter-measuring machine for device electrical parameters. HRI 580L has a comprehensive software package with an intuitive user interface to assist in the configuration, operation, and data analysis of the tool. The installed software includes an advanced graphical user interface, field programming software, mapping tools, and automated metrology capabilities for metrology data collection, data processing, and review. HANRA HRI 580L is equipped with state-of-the-art hardware and software, allowing for detailed inspection and characterization of nanoelectronics, photomask, and MEMS devices. The robust asset design combined with the high-accuracy test and measurement solutions ensure that this advanced model will provide reliable and repeatable results. Finally, HRI 580L provides users with a comprehensive and cost-effective solution for testing and measuring nanoelectronic devices and mask, photomask, and MEMS devices. This equipment is ideal for research and development laboratories, semiconductor manufacturers, and other organizations who need a reliable metrology and testing system for these types of devices.