Used HERMES MICROVISION / HMI Epointer2 #293616965 for sale

HERMES MICROVISION / HMI Epointer2 is a wafer testing and metrology equipment designed to enable advanced measurement capabilities and higher throughput in semiconductor metrology laboratories. The system is capable of analyzing a variety of materials, including semiconductor films, epitaxial layers, MOS gate oxides and contact topographies, using advanced optical microscopic inspection. The unit integrates a fully automated wafer handling/export machine, allowing for a seamless transition between loading and measurements. The robotic arm allows for the rapid transfer, positioning and alignment of wafers for testing, helping to reduce test times and improve productivity. The innovative optical configuration and intuitive setup software allow for precise, accurate measurements to be taken quickly and accurately, over the entire area of the wafer. HMI Epointer2 tool uses a high-resolution optical microscope with an ever-expanding set of measurement techniques, enabling advanced and highly sensitive data acquisition and analysis. The asset features an integrated laser interferometer, laser imaging portfolio, advanced optical imaging filters and with a wide-field scanning capability and provides a variety of options for data analysis, including automated algorithms and manual interaction. The model also features real-time and dynamic probing option, allowing for single-device analysis and testing of transistor structures. The data is presented graphically, to allow for fast, easy analysis and diagnosis. The intuitive point-and-click interface allows for easy setup and control, providing precise measurements and accelerated testing. The equipment also features an advanced embedded software environment, which is designed to allow for the creation and customizing of testing parameters, making it a particularly powerful tool for precision wafer testing. Additionally, the robust PC-based software and data management system allows for the precise alignment and data processing of samples, providing a powerful foundation for data acquisition and analysis. HERMES MICROVISION Epointer2 is a highly advanced testing and metrology unit, providing a wide range of capabilities and advanced data processing and analysis, enabling more precise, accurate testing and faster time-to-market. This machine is capable of meeting the rigorous requirements of a wide range of applications, and provides a comprehensive and cost-effective solution for wafer testing in semiconductor metrology laboratories.