Used HEXAGON METROLOGY Explorer 08.12.06 #9378670 for sale

HEXAGON METROLOGY Explorer 08.12.06 is a versatile wafer testing and metrology equipment that provides routine or continuous wafer-level metrology or analysis with high throughput and efficiency. The system offers many advantages and features, including advanced image processing, high throughput, and multi-directional search capabilities. The unit is built on a versatile platform using advanced image processing techniques and imaging machine software. Using its proprietary imaging software, the tool provides many features, such as calculation of various geometrical features, cross-sectional analysis, and wafer mapping. It also has advanced optical filters for high-resolution inspection of wafers and mirror-image routines for repeat measurements. The HEXAGON asset is capable of high throughput as it offers a multi-layer multi-directional search capability. Through its rapid movement, it can capture many wafers simultaneously and provide high resolution imaging and metrology data. For in-depth analysis, the model offers an image analysis equipment that can perform multi-dimensional analysis and make correlation measurements among different wafers. In addition to its advanced imaging and analysis capabilities, HEXAGON METROLOGY Explorer 08.12.06 also benefits from advanced instruments and technologies. Automated pattern recognition and other related tools provide results that include an array of analytical and databased applications. The system is also compatible with a wide range of hardware and software components. This makes it applicable to a variety of applications and settings, ranging from wafer production and test to high-end research, development, and advanced metrology solutions. HEXAGON METROLOGY Explorer 08.12.06 is a cutting-edge metrology unit that employs advanced algorithms and instruments to provide high-efficiency and high-throughput wafer-level metrology and analysis. It is suitable for a variety of settings, offering all necessary components to perform optimized testings and measurements. The machine also utilizes image-processing techniques and imaging tool software to provide an array of features and applications.