Used HEXAGON METROLOGY Global Performance #9363429 for sale

HEXAGON METROLOGY Global Performance is an advanced wafer testing and metrology equipment designed specifically to meet the stringent requirements of the chip making industry. The platform offers a comprehensive range of fields including multiple pattern recognition, advanced chip inspection, and a suite of advanced metrology tools. This unique platform offers powerful and disruptive solutions allowing teams to quickly inspect, analyze, and measure extremely precise devices. This particular system is optimized for the chip making industry to perform testing and metrology on a variety of substrates. It features two main components - the inspection and metrology functions. The inspection component is designed for the rapid identification of defects with a high degree of accuracy and repeatability. This component is capable of inspecting a wide range of substrates such as SiO2, SiN3, and quartz. Additionally, it is equipped with a variety of image recognition algorithms and advanced algorithms that are capable of recognizing patterns such as line-beams, circles, and more. The metrology component is designed to measure precision components with nanometer level accuracy. It offers a variety of measurements such as resistivity, reflectivity, topography, and more that are typically used in chip making technology. To ensure accuracy, the unit is equipped with automated calibration tools as well as laser-based alignment capabilities. Additionally, the machine is designed with multijoint robotic manipulators to provide even greater degrees of accuracy and repeatability. Overall, Global Performance platform is an advanced testing and metrology tool that provides teams with powerful and disruptive solutions. It offers a comprehensive range of functions that are designed for the high accuracy and repeatability needed by the chip making industry. Its robust combination of inspections and metrology functions create a unique tool that allows teams to quickly and accurately inspect and measure extremely precise devices.