Used HEXAGON METROLOGY Global Vantage #9363428 for sale

ID: 9363428
Measuring system.
HEXAGON METROLOGY Global Vantage is a powerful wafer testing and metrology equipment designed for the high-volume semiconductor industry. It uses state-of-the-art technology to accurately measure and detect defects on both wafers and substrates. The system has comprehensive inspection capabilities and utilizes both 2D and 3D technologies to detect a wide range of potential defects. Global Vantage offers an automated optical inspection unit for efficient and accurate surface inspection of semiconductor and memory wafers. It is equipped with built-in processes for identifying various kinds of defects such as scratches, foreign particles, and cracks on wafers and substrates. The machine also features a comprehensive CCD image fusion technology that enables the user to combine both frontal and side views of each wafer to better analyze it. The tool also offers a number of sophisticated wafer metrology solutions. Its wafer surface mapping asset provides accurate measurements of the topography of a wafer or substrate. It also supports a wide range of advanced inspection techniques such as SEM, FIB, AFM, and nanoscopy, enabling users to quickly identify microscopic defects in the most demanding semiconductor applications. This powerful, precision model is designed to operate with a minimum of downtime and offers a wide range of equipment configuration options. The system's compact design and easy integration makes it suitable for any semiconductor production environment. It also features a common software interface with remote access, so users can access and configure all sub-systems from any computer station. HEXAGON METROLOGY Global Vantage is a powerful and reliable tool for detecting defects on wafers and substrates. Its sophisticated metrology solutions and automated optical inspection capabilities offer an unmatched level of quality assurance for the most demanding semiconductor production environments. Whether it's used for wafer surface mapping, defect inspections, or for advanced metrology solutions, Global Vantage is the perfect unit for the high-volume semiconductor industry.
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