Used HEXAGON METROLOGY Optiv Classic 443 #293653303 for sale

HEXAGON METROLOGY Optiv Classic 443 is an advanced wafer testing and metrology equipment used in semiconductor manufacturing operations. This system works in a completely automated and integrated manner allowing manufacturers to quickly identify and analyze problems in the fabrication process. Optiv Classic 443 has a modular design with a variety of modules that can be used for different types of testing and metrology processes, including optical inspection, electrical test and optical defect analysis. The unit has a vision machine with a high resolution digital CCD camera, which is capable of imaging wafers from 4" to 12" in size. It also has powerful image processing capabilities, including image inspection analysis, window-based measurements, pattern recognition and quanlitative data analysis. It has a programmable controller with an online display that allows the user to monitor the tool's operation, configuration and status at all times. HEXAGON METROLOGY Optiv Classic 443 also features an advanced defect inspection and characterization asset. This model can detect and classify defects on the surface of a wafer, as well as in the underlying substrate material. It includes selectable algorithms and built-in optical models to further enhance the user's ability to analyze the wafer's surface. Optiv Classic 443 also includes an optical metrology unit, which enables accurate characterization of the wafer's thickness, surface roughness and other optical parameters. The unit is equipped with a motorized periscope, which is used to focus on specific surfaces and to generate very accurate surface images. These images can then be used for dimensional measurements and surface imaging. Finally, HEXAGON METROLOGY Optiv Classic 443 also provides software to facilitate automatic control and automated measurements. This software is compatible with various file types and can be programmed to capture and store data. This data can then be used for data analysis and comparison between different wafers and different runs. Additionally, the software can be used to generate reports for further analysis and review. All in all, Optiv Classic 443 is a powerful wafer testing and metrology equipment that can be used to ensure the highest quality production standards in semiconductor and electronics fabrication. Its modular design allows for multiple modules to be used in tandem or independently, enabling testing and metrology operations to take place with increased accuracy and efficiency. Furthermore, the software capabilities and automated control systems of the system provide manufacturers with the ability to quickly and accurately address any problems in the fabrication process.