Used HEXAGON METROLOGY Optiv Classic 443 #9408473 for sale

HEXAGON METROLOGY Optiv Classic 443 is a next-generation wafer measurement and metrology equipment developed by HEXAGON METROLOGY. It is designed for both research and industrial applications, offering high accuracy and precise measurement of wafers up to six inches in diameter. Optiv Classic 443 is a versatile system that can measure a broad range of characteristics, from a single contour or straightness measurement to surface roughness and film thickness measurement. HEXAGON METROLOGY Optiv Classic 443 also provides superior machine vision for wafer inspections and topographical measurements, as well as an integrated scripting language for custom applications. Optiv Classic 443 has a unique modular design, consisting of an XY stage, a Z-axis and a spindle rotary table. It is equipped with an integrated optical unit that enables the machine to measure the characteristics of a wafer with the highest level of accuracy, including contours, concentricity, straightness, flatness, and critical dimensions. The integrated software package Titavis Classic provides easy-to-understand measurements with intuitive graphics, saving time and reducing user errors. HEXAGON METROLOGY Optiv Classic 443 is equipped with a TiAlN coated diamond stylus, which is designed to provide a high level of surface accuracy. The tool also features a manual positioning option, providing a range of measurements with a single stylus movement. Additionally, Optiv Classic 443 is equipped with an integrated manual light source, allowing for improved visibility in low light conditions. Additionally, HEXAGON METROLOGY Optiv Classic 443 has a variety of additional features, such as an automatic stylus control for variable speed control, which allows for more precise measuring by reducing over-measurements. The asset also features a range of software packages that allow for custom measurement routines and scripting functions. The scripting language allows users to create custom measurement routines with ease, providing maximum flexibility. Overall, Optiv Classic 443 is an innovative, versatile and reliable wafer measurement and metrology model. It offers a range of features and benefits that make it suitable for a variety of applications in research and industry. The high accuracy and precise measurement capabilities make HEXAGON METROLOGY Optiv Classic 443 a great choice for any wafer testing or metrology needs.