Used HITACHI JG-0148 #9377467 for sale

HITACHI JG-0148 is a wafer testing and metrology equipment used in the semiconductor industry. It is equipped with a powerful image analysis system and is designed for high-accuracy, high-precision measurements of wafers for the development of new process technologies. The unit uses up to 30- magnification microscopy and advanced illumination techniques to enable reliable surface and sample analysis. JG-0148's algorithms are capable of automatically detecting and identifying various types of particles and objects on surfaces of wafers. Furthermore, the machine enables users to perform 2D scan measurements compliant with JIS, SOPs and SEMI standards. The advanced capabilities of the image analysis software enable users to accurately measure dimensions and profiles of wafers. The data acquired by the tool can be stored and retrieved from the onboard CF memory as well a USB devices and CDs. Furthermore, it can also be output to an external printer, allowing users to analyze data away from the asset. Additionally, HITACHI JG-0148 model has various features such as stimulus control, precision tracking, petri dish placement, and sample protection, all of which improve its accuracy and efficiency. Furthermore, the equipment is designed to meet the needs of production environments as it has an ergonomically designed LCD monitor and flexible imaging operations. It also has the ability to measure defects on multiple wafers and to collect stats, which allows for improved process control. This also enables faster development of new process technologies. To ensure minimal maintenance and increase the lifetime of the system, JG-0148 uses a secure shut-off circuit, spark-resistance unit, and a dust prevention mechanism. This provides a long lasting and reliable measurement solution for the semiconductor industry. Overall, HITACHI JG-0148 is an advanced machine that provides high resolution and accuracy for wafer testing and metrology. It is highly user friendly and offers a robust set of features and tools to enable quicker product development. By offering the ability to detect and identify particles on wafer surfaces, JG-0148 tool improves the efficiency of production lines and provides reliable results.