Used HITACHI / KOKUSAI VR-200 #9230477 for sale

HITACHI / KOKUSAI VR-200 wafer testing and metrology equipment is used to allow for accurate and efficient process control in the semiconductor industry. This machine is used to measure the electrical parameters of each wafer after metrology processes have been performed. This ensures that each wafer meets the industry standards and that the device is within the range of acceptable tolerances. HITACHI VR-200 is a reduced-level metrology system, as it only measures the parameters of wafers that have already been metrologically verified within a production environment. This unit is capable of measuring two wafers simultaneously, at up to a rate of 100 wafers per hour. The measurement time window is also incredibly fast, with the die-level measurements taking an average of two seconds per wafer. In order to get accurate results, KOKUSAI VR-200 is equipped with several wafer handling mechanisms that ensure precise external alignment of each wafer. The machine also has a specialized wafer mapping routine that allows it to perform measurements with very high precision. The tool utilizes several state-of-the-art imaging techniques that provide accurate and detailed measurements of each wafer. VR-200 has a proprietary signal processing algorithm that ensures that any false signals are ignored and only the correct signals are used in the measurements. It also uses a sophisticated asset of identification, cross-referencing and calibration techniques to ensure that the measurements are accurate. This also enables the model to be self-calibrating, so that no manual maintenance is necessary. HITACHI / KOKUSAI VR-200 produces detailed reports with all the required information, including nominal and cross wafer readings, die-level indications, set-point readings, yield analysis and statistical analysis. This comprehensive report can be used as a tool for process control in order to ensure that all wafers are of the highest quality. HITACHI VR-200 wafer testing and metrology equipment is a reliable and efficient solution for the semiconductor industry. It is highly accurate and produces comprehensive reports that can be used for process control. It is designed for fast and efficient testing and is equipped with reliable wafer handling techniques and signal processing algorithms to ensure accurate results.