Used HITACHI / KOKUSAI VR-200 #9231050 for sale

HITACHI / KOKUSAI VR-200 is a fully integrated wafer testing and metrology equipment that features advanced alignment, testing, and metrology capabilities. The system is composed of components for measurement of parameters and metrology, including an inspection unit, a conductivity test meter, an electrical test unit, and a laser for wafer probing. The machine is also equipped with an optional edge station for wafer-edge up viewing. The tool is capable of measuring various electrical and optical characteristics during wafer testing and metrology, such as contact resistance, capacitance, resistivity, permittivity, current leakage, inductance, and optical properties. It can also measure the topography of each of these parameters independently on a single wafer at resolutions up to one micro-m. The asset is designed for testing both optical components and integrated circuits, and has a wide range of compatible test targets and sample types. It also offers a built-in recorder for accurate and reproducible results. The model is designed for efficient and rapid testing of various wafers with both manual and automatic detection capabilities. To ensure accurate measurement results, the equipment is equipped with a high precision and high resolution CCD camera, allowing for optical imaging of both optical and electrical properties. Furthermore, HITACHI VR-200 features powerful field emission microscopy (FEM) capabilities for superior imaging of devices under test. The system also offers a user-friendly interface that enables quick and easy setup. With the unit's intuitive menu-based control machine, users can easily configure the tool for the desired test parameter and sample requirements. The asset comes with comprehensive support for several software packages, which enable users to quickly and conveniently customize it for the specific application. The model is compatible with most industry standard test chambers, allowing for field-testing as well as laboratory measurement. The equipment also offers several additional features including a probe card holder for use in wafer-level testing. KOKUSAI VR-200 can be combined with other test and metrology instruments to create a complete wafer testing solution. For laboratories, VR-200 offers an advanced testing system with superior accuracy, repeatability, and speed. Its wide array of features make it an ideal choice for wafer testing and metrology.