Used HITACHI ZA-H200PVI2 #9412552 for sale

HITACHI ZA-H200PVI2 wafer testing and metrology equipment is a high precision, fully-integrated metrology system designed to provide accurate and reliable performance across a variety of applications. It is designed to measure most wafer parameters, including critical dimension (CD), overlay, and uniformity. The unit is capable of measuring on a variety of wafer substrates, including silicon, gallium arsenide, indium phosphide, and others. It features an advanced optical machine including a scanning electron microscope (SEM) detector and laser auto focusing tool, resulting in superior resolution, accuracy, and repeatability. The asset also includes an improved sample stage to provide repeatable motion and positioning accuracy. ZA-H200PVI2 includes a full range of measurement options allowing users to select the best combination for their application. The model supports both manual and automated systems for sample handling, up to five axes of automation, and allows for the integration of specialized tools designed for particular types of wafers. This equipment also supports automated feature extraction and measurement, automated operation, and iterative feedback control. The system incorporates sophisticated metrology software that provides users with numerous functions related to data collection, analysis, and reporting. This allows users to quickly and accurately analyze the data. The software also provides a wide range of automated and semi-automatic tools for better data control. The software is capable of high-speed visualization and analysis of data, and the unit can generate precise real-time, three-dimensional data at the click of a button. Overall, HITACHI ZA-H200PVI2 is a precise, reliable and efficient wafer testing and metrology machine, suitable for a variety of applications. It offers a comprehensive range of features and functions with advanced software for accurate and reliable analysis and data management.