Used HOMMEL-ETAMIC W10 #293755236 for sale
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ID: 293755236
Surface profile roughness gauge
Type: Skidded pick up
Maximum traversing length 17.5 mm, Cut Off 0.25 / 0.8 / 2.5 / mm
(40) Surface roughness parameters according to DIN EN ISO 4287, DIN EN ISO 13565, ISO 12085 and JIS B601 MOTIF
(7) Measuring programs with individual measurement / evaluation conditions
Touch screen: 4.3" (11 cm) color
Display of parameters, profiles, material ratio and statistical data
Integrated printer with Easy-Paper-Loading function
Memory for 2000 readings and 500 profiles for each measuring program
USB - interface for PC connection
Operation: Cord/cordless
Base unit with rest and barrel jack
Traverse unit LV17, 17.5 mm tracing length, tripod legs
Pick up T1E, 2μm/90°, skid radius 30/1.95 mm
Integrated surface roughness standard with data sheet
Calibration Certificate for the instrument
2 Rolls of printer paper
Probe protection with lighting
Support prism for small shafts
Charger/AC Adapter: 100 V to 240 V
USB Cable
Instruction manual.
HOMMEL-ETAMIC W10 is an advanced wafer testing and metrology equipment that offers highly precise and accurate measurement capabilities for evaluating the quality and performance of semiconductor wafers. This system is designed to meet the demanding requirements of the semiconductor industry, providing a comprehensive solution for wafer inspection, testing, and analysis. At the heart of W10 unit is a sophisticated metrology platform that utilizes cutting-edge technologies to measure key parameters of semiconductor wafers with exceptional precision. The machine is equipped with a range of sensors and measurement modules that allow users to assess various aspects of wafer quality, such as surface roughness, flatness, thickness, and defect detection. One of the key features of HOMMEL-ETAMIC W10 tool is its high-resolution imaging capabilities, which enable users to capture detailed images of wafer surfaces at microscopic levels. This allows for the identification and analysis of defects, contaminations, or irregularities that may affect the performance of the wafers. The asset also offers advanced imaging algorithms and image processing tools to enhance image quality and extract valuable data from the images. In addition to imaging capabilities, W10 model is equipped with precise measurement tools that allow users to quantify important wafer parameters, such as surface roughness and flatness. The equipment utilizes various metrology techniques, including stylus profiling, optical interferometry, and laser scanning, to accurately measure the topography of wafer surfaces and provide detailed information about surface characteristics. Furthermore, HOMMEL-ETAMIC W10 system offers automated measurement and analysis routines that streamline the testing process and ensure consistent and reliable results. The unit can be programmed to perform repetitive measurements on multiple wafers, allowing for efficient data collection and analysis. Additionally, the machine features user-friendly software interfaces that enable intuitive operation and data visualization for users of all skill levels. Another notable feature of W10 tool is its versatility and scalability, allowing users to customize the asset to meet specific testing requirements and accommodate different wafer sizes and types. The model can be equipped with additional modules and accessories to expand its measurement capabilities and address specific testing needs in the semiconductor industry. Overall, HOMMEL-ETAMIC W10 equipment represents a state-of-the-art solution for wafer testing and metrology, offering advanced technology, precise measurement capabilities, and user-friendly operation. With its comprehensive features and customizable options, the system is well-suited for semiconductor manufacturers, research institutions, and testing laboratories seeking to ensure the quality and reliability of their semiconductor wafers.
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