Used IMS / NANOTECH LVIS-V #9314422 for sale

IMS / NANOTECH LVIS-V Wafer Testing and Metrology equipment is a full-featured tester and metrology platform designed for advanced semiconductor device fabrication. This integrated system provides a comprehensive set of metrology tools, including a test head, view camera, vision unit, analytical techniques, and data acquisition capabilities all contained within one fully integrated platform. The test head comprises an automated powered stage and a die treater. The stage accommodates up to 200mm wafers, making it suitable for the testing of large substrates. The die treater is used for coating or structuring the bevel of the die, removing grains or staining wafers, and for partial encapsulation applications. The view camera is designed to capture the die's structural and topographical information using an integrated microscope. The vision machine uses laser scanning and a multi-zone metrology tool to produce a 3D scan of the wafer's surface. This data is used to measure the thickness, surface roughness, surface area, and other parameters of the wafer. The asset also includes a variety of analysis tools including electrical tests, optical tests, and pattern recognition for further characterization of the device. The data acquisition capabilities of the model enable the storage, retrieval and analysis of the test results. All acquired data can be stored on a secure remote server for easy evaluation and reporting. Furthermore, several of the analysis tools available on the equipment are designed for automated evaluation, reducing the need for manual intervention. IMS LVIS-V Wafer Testing and Metrology system is designed for comprehensive wafer testing and metrology, providing researchers with a powerful and reliable platform for both research and production tasks. It enables improved device analysis and is especially useful for facilitating the development and manufacturing of advanced semiconductor devices.