Used INSPECTROLOGY IVS-165 #293648851 for sale

INSPECTROLOGY IVS-165 is a modular, high-performance wafer testing and metrology equipment offering the ability to identify any potential defects on each and every single wafer, comprising of a highly configurable, comprehensive suite for in-depth and comprehensive analysis. Its comprehensive feature set allows for testing on a variety of different materials and substrates - ranging from silicon to GaAs, InP and beyond. The system enables trapping and detailed analysis of any metrology or defect present on each wafer. It allows for a wide range of image review, including 2D and 3D imaging, unaided color imaging, lumens and optical density, bias, spot size, contouring and auto-segmentation referencing, and auto-alignment. In addition, the unit offers advanced defect performance analysis, ranging from fuzzy defect investigations to automatic wafer orientation and classification, comprehensive defect data extraction and scrutinization, and comparison of multiple wafers. The detailed information captured by the machine, such as coordinate locations and errors in the defects, can then be used to improve process stability and enhance the overall yield. IVS-165 also features powerful stylus and SEM inspection capabilities, such as high-resolution particle analysis and 3D surface profiling, as well as auto-stitching of images with minimum user interference. Furthermore, its high-speed metrology quickly characterizes wafers across multiple die sections, allowing for optimization of automated microprobing testing results. Finally, INSPECTROLOGY IVS-165 incorporates extremely reliable and accurate placement, high-speed motion control and data acquisition and communication, ensuring that high-performance test protocols are faithfully followed with minimal distortion. The tool's exceptional accuracy, combined with its high availability, ensures faster and accurate results.