Used ISIS SENTRONICS SemDex 300 #9269325 for sale

ISIS SENTRONICS SemDex 300 is a wafer testing and metrology equipment providing efficient and accurate wafer defect analysis, measurement, and sorting. It uses transmission electron microscope (TEM) technology to facilitate high-resolution imaging and 3D topography mapping. When used together, these features allow for defect detection, wafer fabrication defect detection, non-destructive metrology, and back-side analysis across a wide range of capacitive and resistive samples. The system employs a dual-wavelength interferometer for optics in order to achieve superior accuracy when measuring structures down to a nanometer level. The advanced level of accuracy ensures a high level of precision for all wafer fabrication tasks. Additionally, the unit utilizes a unique universal-reference technology to ensure information is accurately collected and shared between the metrology machine and other equipment (e.g. C-CAD software, machine vision). SemDex 300 also makes use of a proprietary high-tolerance scanning tool. This high-speed scanning asset is capable of accurately generating megapixel images in just a few minutes. This allows for accurate detection of defects and process variations in an efficient manner. In addition, the model features multiple standard and custom inspection modes including brightfield, darkfield, automated indexing, and manual inspection. The multiple inspection modes provide a robust approach when analyzing different kinds of wafer-related defects. Finally, ISIS SENTRONICS SemDex 300 also offers integration with other software tools and hardware solutions. This allows users to leverage the software's high-performance processing capabilities for a range of other tasks. With the ability to build customized software applications on the platform, along with features like automated data logging and analysis, the SENTRONICS SemDex 300 is a powerful and versatile solution for wafer testing and metrology.