Used ISIS SENTRONICS SemDex 301-2 #9228734 for sale

ISIS SENTRONICS SemDex 301-2 is a wafer testing and metrology equipment which is specifically designed to enable a comprehensive characterization of various types of semiconductor structures. The system consists of two primary components, namely a high resolution optical microscope which is capable of imaging structures down to the nanometer scale, and a pattern recognition unit which is used to accurately locate and measure the various features found within the structure. Additionally, the machine also features a range of optional accessories such as a laser microscope, a confocal microscope, a Raman spectrometer, and a-scanner, providing users with great flexibility in terms of their ability to perform detailed structural analysis. At the heart of SemDex 301-2 is the high resolution optical microscope which is capable of imaging structures down to the nanometer scale. The microscope is equipped with a variety of objective lenses, allowing users to effectively perform imaging of a wide range of materials including silicon, metal and dielectric layers. Images are perfectly focused using advanced auto-focus technology, ensuring consistent results. Furthermore, the unique optical configuration of the microscope allows for high dynamic range imaging, resulting in extremely detailed results and greatly improving the accuracy of measurements at all scales. Next, ISIS SENTRONICS SemDex 301-2 is equipped with a highly sophisticated pattern recognition tool which greatly improves the accuracy of feature detection and measurement, especially for high density structures. This asset is capable of locating and measuring even the most complex feature patterns such as TSV's, flip chips and dielectric layers. The measurement data obtained from this model is extremely accurate and reliable, as it is based solely on direct measurements rather than assumptions. Finally, in addition to its already impressive range of capabilities, SemDex 301-2 comes with a range of optional accessories which allow for an even greater degree of structural analysis. A laser microscope is available for real-time imaging of electrical characteristics, while a confocal microscope and a-scanner can be used to perform non-destructive chemical and physical measurements. Additionally, a Raman spectrometer is also available, allowing for precise analysis of chemical composition. In conclusion, ISIS SENTRONICS SemDex 301-2 is a powerful and versatile wafer testing and metrology equipment which offers a comprehensive high resolution imaging and feature recognition. The system is ideal for many different types of applications, allowing its users to confidently perform accurate, reliable and detailed wafer testing and analysis.