Used JING YANG ENTERPRISE JICFVI #9363806 for sale

JING YANG ENTERPRISE JICFVI is an advanced wafer testing and metrology system designed to provide comprehensive testing and inspection. Capable of assessing the electrical and optical properties of a wide range of products including chips, die-attach, and other wafers, JICFVI platform features advanced optical microscopy, integrated probing stations, andwafer handling and alignment systems. The advanced optical microscopy capabilities of JING YANG ENTERPRISE JICFVI system allow users to quickly and accurately identify defects, measure coveragethroughout the wafer's active and inactive areas, and gauge any contaminant particulates that may be present. These optical measurements are further enhanced with industry-leading automated probing stations that are designed for the precise testing of electrical and optical properties. The wafer handling and alignment are equally as important for ensuring overall accuracy and reliability when conducting tests and inspections. JICFVI platform employs a robotic arm and various interchangeable end-effectors to rapidly and accurately manipulate and position the wafer. The arm and effectors can also be used to detect and measure the presence of contamination, edge curvature, surface flatness, and more. By combining powerful optical microscopy, automated probing, and sophisticated wafer manipulation, theJing Yang Enterprise JING YANG ENTERPRISE JICFVI is a state-of-the-art wafer testing and metrology system for electronics manufacturers and research laboratories. This top-of-the-line platform ensures the highest levels of accuracy and reliability when it comes to inspecting and testing the electrical and optical properties of ICs, chips, die-attach, and other wafer-based products.