Used JORDAN VALLEY JVX 7300 #9383216 for sale

ID: 9383216
Film thickness measurement system, 12" Optics non functional.
JORDAN VALLEY JVX 7300 is a state-of-the-art wafer testing and metrology equipment suitable for research and industrial applications. It offers a high level of accuracy and stability, providing a wide range of options for the testing and analysis of semiconductor wafers. The system consists of a base unit, which provides both scanning and testing capabilities, as well as an optical microscope for high-resolution imaging. Scanning is provided by a pair of high-precision flyscan stages, which provide fast and accurate scanning of the entire wafer surface. The unit also features a motorized XY stage, which enables fast and accurate alignment of the scanning head with the wafer. In addition to scanning and testing capabilities, JVX 7300 also features a range of metrology tools and attributes. This includes a high-resolution CCD camera, which is capable of capturing and analyzing the physical characteristics of wafers. It also includes a light source, which uses a range of wavelengths to image the existing topography of the wafer surface and a software package, which can be used to measure, analyze and compare a wide range of statistics and parameters. The hardware components of the machine are complemented by a highly advanced software suite, which offers a range of tools and features to further enhance the capabilities of the equipment. This includes automatic data loggers, which allow users to save, monitor and adjust the settings of their tool as well as provide detailed reports on the results. The suite also encompasses the ability to view and compare generated images, providing technicians with a further layer of analysis. Finally, JORDAN VALLEY JVX 7300 also offers a wide range of connectivity options, including both USB and Ethernet ports. This allows for the asset to be accessible remotely, allowing for the sharing of data and the creation of collaborative networks. In sum, JVX 7300 provides an accurate and versatile wafer testing and metrology model. Featuring a comprehensive range of hardware and software components, this equipment provides users with a comprehensive and efficient platform for analysis and comparison of different types of wafers.
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