Used KEITHLEY 6220 #9111566 for sale

KEITHLEY 6220 is a high-performance, wafer testing and metrology equipment designed to provide accurate measurements from device wafers. The system features a high-precision, automated wafer handler, allowing for accurate and repeatable wafer positioning. It is equipped with fully programmable automatic stage motion that provides fast and precise wafer placement and tool positioning. The unit has an integrated metrology package to accurately measure wafers. The metrology package includes a high-resolution optical microscope, laser interferometers, and a range of optical lecterns for precise wafer movement and scanning capabilities. The measurement capabilities include profile measurements for height, width, hole diameter, and sidewall angle, as well as reflective index and line width measurements. 6220 wafer testing and metrology machine can be configured to run with various process techniques, including thermal processes, epitaxial growth, ion implantation, chemical etching, photolithography, dielectric deposition, and spacer fabrication. The tool includes an integrated control console and test and sensitive measurement instruments, which offer test and metrology data collection for process control and production yield improvement. The console also features a comprehensive TEK-CARE database that allows users to store and compare test and metrology data. The asset includes a temperature monitor that can be set to provide feedback on temperature changes during wafer testing and metrology. Additionally, the model has capability to perform in-situ spectroscopy, allowing for spectroscopic technique to measure optical properties of the integrated circuit. Finally, tests performed on KEITHLEY 6220 wafer testing and metrology equipment are repeatable and reliable. The system is designed with a built-in calibration unit, which ensures data accuracy and repeatability. This allows the machine to provide accurate measurements to the user. It also ensures that any errors or fluctuation can be quickly identified and corrected, thereby improving the tool's overall performance.