Used KEM / KOKUSAI VR-120S #9099745 for sale

KEM / KOKUSAI VR-120S is a latest wafer testing and metrology equipment that is designed to maximize the output of device characterization, test and analysis. It allows for precise measurements of electrical, optical and mechanical properties of semiconductor devices. KEM VR-120S incorporates unique technologies such as Non-contact Laser Profilometry, Colruyt Displacement Sensor and Atomic Force Mechanical Microscope, that allow for a deeper and more accurate understanding of the structure of a device, as well as its design and operational drivers. The system consists of various components that cooperate to enable wafer testing and metrology, allowing for intricate analysis of the physical attributes of semiconductor devices. KOKUSAI VR-120S comprises an optical material characterization unit, a non-contact laser profilometer, a colruyt displacement sensor and a flexible alignment machine. This combination provides a high degree of flexibility and accuracy for obtaining data on the structure and properties of semiconductor devices. Therefore, this tool can measure static, dynamic and electrical properties of semiconductors with high resolution. The optical material characterization asset enables researchers to measure the optical materials properties with great accuracy. It is capable of positioning and focusing an optical beam on the sample and utilising the associated signals to obtain information on the structure and properties of the device. Furthermore, the non-contact laser profilometer allows for the capture and analysis of two-dimensional topographical and surface profile data related to device components. The flexible alignment model allows for precise and repeatable wafer positioning and handling to increase efficiency and accuracy in data collection. It also includes a colruyt displacement sensor that offers fast measurement of surface profile with only a limited number of sample points. It enables researchers to detect surface non-uniformities and defects in a short period of time. VR-120S is definitely an ideal tool for characterizing electronic components and performing precise wafer testing and metrology. Its combination of powerful and precise technologies enables accurate measurements of electrical, optical and mechanical properties, yielding detailed data for further investigation. This equipment is a great product for its ability to assess and optimize device structure and operational performance.