Used KEYENCE LK-G87 #9011593 for sale

KEYENCE LK-G87 is a wafer testing and metrology equipment that is capable of automatically inspecting wafers for defects, measuring parameters, and identifying and evaluating device characteristics—allowing users to quickly and accurately monitor and evaluate the quality of the wafer. This system integrates advanced technologies, such as non-contact optically and laser scanning for measurement accuracy and repeatability, and means that it is capable of rapidly and automatically monitoring a variety of processes in the semiconductor manufacturing process, allowing for improved efficiency and greater product yield. The unit has a high speed scanning speed and robust platform, making it ideal for tests and analysis of challenging production environments. It also has the capability to accurately measure high-end devices at high speed due to its advanced optical zooming machine and multi-angle scan capabilities. This enhances analysis accuracy and throughput speed. Additionally, LK-G87 has an automated handling tool to help with fast, safe and efficient handling of the wafers. This asset reduces the time spent in processing and produces quick and reliable results. The wafer testing and metrology model can also measure physical parameters such as gate oxide thickness, gate pitch, contact hole dimensions, surface roughness, and others. This equipment has the ability to support both 2D and 3D profiles, making it ideal for analyzing features on the wafer with complex topology. Additionally, in order to streamline the measuring and analysis process, KEYENCE LK-G87 offers hierarchical detection abilities and a depth-comparison program, which allows users to check if multiple layers on the wafer are within accurate tolerances. Furthermore, the system also offers a defect detection module to help to identify any potential defects that could show up on the wafer surface. This unit is capable of locating and flagging objects automatically, greatly reducing the time and effort in finding any type of defects. Finally, the machine is equipped with advanced device production analysis capabilities to evaluate device characteristics, giving users the ability to measure and evaluate their parts with great detail. In conclusion, LK-G87 is an optimal wafer testing and metrology tool for accurate and efficient inspections. With the combination of fast scanning, superior accuracy, automated handling abilities, defect detection module and device production analysis capabilities, KEYENCE LK-G87 offers excellent capabilities to ensure a high quality wafers with greater efficiency.