Used KIC 2000 #9360988 for sale

KIC 2000 is a wafer testing and metrology equipment which offers both wafer testing and metrology capabilities for semiconductor wafer production processes. It is based on a scanning electron microscope (SEM) and an optical microscope for process control on heavily-doped and chemically-textured wafers. The system features simultaneous acquisition and simultaneous analysis of critical dimensions and properties such as film thickness, surface topography, and defect inspection. The unit also has image stitching capabilities to control post fabrication wafer warpage. The machine is suited for technologies such as Silicon on Insulator (SOI) and Arrayed Wafer Level Packaging (AWLP) lines. 2000 tool utilizes a Zeiss Auriga SEM and an optical microscope that is equipped with Kla-Tencor's proprietary High Resolution Defect Inspection (HRDI) technology. This technology provides automated scanning, detection, and classification of wafer defects in less than 60 seconds. The high resolution SEM minimizes signal interference from edge effects and enables any measurement from within 1µm to 3mm with high accuracy. The optical microscope features a solid-state analytical platform with built-in capabilities for various applications such as CD, DTA, and SSP. The CD readout asset supports resolutions from 0.1µm to > 3mm. KIC 2000 also features Kla-Tencor's SemiVision software for optimizing test configurations and patterns and easy integration of existing wafer level processes. The software can monitor, predict, and diagnose defects at the wafer level from the acquired test data. Additionally, it allows viewing the simultaneous data from the optical and SEM in real-time. It also provides automated data collection and analysis of wafer warp and edge profile metrics, and feature coverage, together with automated Z-axis measurements and stitching. The software is built with a smart programming interface, user-friendly interface, and precise SPC data printing that is compliant with industry standards. In summary, 2000 is a comprehensive wafer testing and metrology model that provides automated 2D inspection, 3D metrology, and image stitching capabilities for various applications in the semiconductor industry. It is equipped with the HRDI technology for faster SEM image transfer and higher resolution images. Additionally, the equipment is integrated with SEMVision for optimized test patterns and easy integration of existing wafer level processes.